Invention Grant
- Patent Title: Method of forming copper wire
- Patent Title (中): 铜线形成方法
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Application No.: US10748254Application Date: 2003-12-31
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Publication No.: US07144812B2Publication Date: 2006-12-05
- Inventor: Kazuhide Abe
- Applicant: Kazuhide Abe
- Applicant Address: JP Tokyo
- Assignee: Oki Electric Industry Co., Ltd.
- Current Assignee: Oki Electric Industry Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rabin & Berdo, PC
- Priority: JP2003-113648 20030418
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
Cu is nitrided to form a nitride of Cu 5 on a Cu wiring layer 1. A diffusion base material layer 6 used as a diffusion source and a barrier metal layer 7, which are interdiffused with Cu, are formed on the nitride of Cu 5. With heat treatment, the Cu wiring layer 1 and the diffusion base material layer 6 are interdiffused to form an alloy layer of Cu 8 between the Cu wiring layer 1 and the barrier metal layer 7.
Public/Granted literature
- US20040209462A1 Method of manufacturing semiconductor device Public/Granted day:2004-10-21
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