Invention Grant
- Patent Title: Electro-optical device, method of checking the same, and electronic apparatus
- Patent Title (中): 电光装置,检查方法以及电子装置
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Application No.: US11103531Application Date: 2005-04-12
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Publication No.: US07145533B2Publication Date: 2006-12-05
- Inventor: Yoichi Imamura
- Applicant: Yoichi Imamura
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2004-150462 20040520
- Main IPC: G09G3/30
- IPC: G09G3/30 ; G09G3/32

Abstract:
To effectively check a plurality of unit circuits, each including an electro-optical element and a control circuit. Each unit circuit U includes an OLED element and a control circuit for controlling operation of the OLED element. A check signal for tentatively driving the OLED element is input to a check terminal TPa1. A switching element is connected to a check unit circuit Ut, located at a corner of an effective region A, of the plurality of unit circuits U. The switching element is changed from an on state where the OLED element in the check unit circuit Ut is electrically isolated from the check terminal TPa1 to an off state where the OLED element in the check unit circuit Ut is electrically connected to the check terminal TPa1.
Public/Granted literature
- US20050258769A1 Electro-optical device, method of checking the same , and electronic apparatus Public/Granted day:2005-11-24
Information query
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