Invention Grant
- Patent Title: Low-energy charged particle detector
- Patent Title (中): 低能带电粒子检测器
-
Application No.: US10857215Application Date: 2004-05-28
-
Publication No.: US07148485B2Publication Date: 2006-12-12
- Inventor: Gary A. Gibson
- Applicant: Gary A. Gibson
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01T1/24
- IPC: G01T1/24 ; H01L31/02

Abstract:
A low energy charged particle detector having a diode with a first layer and a top layer physically coupled to the first layer. The intersection between the first layer and the top layer defines a junction. The top layer is composed of a two-dimensional material such as a chalcogen-based material, providing an electrically passivated exposed outer surface opposite to the junction. The outer surface is exposed to receive low-energy charged particles from external sources. An appropriate control circuit is coupled to the diode, and operable to recognize the incidence of a particle upon the outer surface as a change in current or voltage potential.
Public/Granted literature
- US20050263708A1 Low-energy charged particle detetor Public/Granted day:2005-12-01
Information query