发明授权
- 专利标题: MOS transistors having inverted T-shaped gate electrodes
- 专利标题(中): MOS晶体管具有倒置的T形栅电极
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申请号: US10683782申请日: 2003-10-10
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公开(公告)号: US07154154B2公开(公告)日: 2006-12-26
- 发明人: Shin-Ae Lee , Dong-gun Park , Chang-sub Lee , Jeong-dong Choe , Sung-min Kim , Seong-ho Kim
- 申请人: Shin-Ae Lee , Dong-gun Park , Chang-sub Lee , Jeong-dong Choe , Sung-min Kim , Seong-ho Kim
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel Sibley & Sajovec
- 优先权: KR10-2002-0062009 20021011
- 主分类号: H01L29/76
- IPC分类号: H01L29/76
摘要:
MOS transistors have an active region defined in a portion of a semiconductor substrate, a gate electrode on the active region, and drain and source regions in the substrate. First and second lateral protrusions extend from the lower portions of respective sidewalls of the gate electrode. The drain region has a first lightly-doped drain region under the first lateral protrusion, a second lightly-doped drain region adjacent the first lightly-doped drain region, and a heavily-doped drain region adjacent to the second lightly-doped drain region. The source region similarly has a first lightly-doped source region under the second lateral protrusion, a second lightly-doped source region adjacent the first lightly-doped source region, and a heavily-doped source region adjacent to the second lightly-doped source region. The second lightly-doped regions are deeper than the first lightly-doped regions, and the gate electrode may have an inverted T-shape.
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