发明授权
- 专利标题: Method of manufacturing a semiconductor device
- 专利标题(中): 制造半导体器件的方法
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申请号: US11066253申请日: 2005-02-28
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公开(公告)号: US07169689B2公开(公告)日: 2007-01-30
- 发明人: Shunpei Yamazaki , Taketomi Asami , Mitsuhiro Ichijo , Toru Mitsuki , Yoko Kanakubo
- 申请人: Shunpei Yamazaki , Taketomi Asami , Mitsuhiro Ichijo , Toru Mitsuki , Yoko Kanakubo
- 申请人地址: JP Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Kanagawa-ken
- 代理机构: Nixon Peabody LLP
- 代理商 Jeffrey L. Costellia
- 优先权: JP2000-140816 20000512
- 主分类号: H01L21/205
- IPC分类号: H01L21/205 ; H01L21/20
摘要:
Contamination of an interface of respective films constituting a TFT due to an contaminant impurity in a clean room atmosphere becomes a great factor to lower the reliability of the TFT. Besides, when an impurity is added to a crystalline semiconductor film, its crystal structure is broken. By using an apparatus for manufacturing a semiconductor device including a plurality of treatment chambers, a treatment can be made without being exposed to a clean room atmosphere in an interval between respective treatment steps, and it becomes possible to keep the interface of the respective films constituting the TFT clean. Besides, by carrying out crystallization after an impurity is added to an amorphous semiconductor film, the breakdown of the crystal structure of the crystalline semiconductor film is prevented.
公开/授权文献
- US20050158922A1 Method of manufacturing a semiconductor device 公开/授权日:2005-07-21
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