发明授权
- 专利标题: Alternating phase shift mask design conflict resolution
- 专利标题(中): 交替相移掩模设计冲突解决
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申请号: US10272104申请日: 2002-10-15
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公开(公告)号: US07178128B2公开(公告)日: 2007-02-13
- 发明人: Hua-Yu Liu , Christophe Pierrat , Kent Richardson
- 申请人: Hua-Yu Liu , Christophe Pierrat , Kent Richardson
- 申请人地址: US CA Mountain View
- 专利权人: Synopsys Inc.
- 当前专利权人: Synopsys Inc.
- 当前专利权人地址: US CA Mountain View
- 代理机构: Bever, Hoffman & Harms, LLP
- 代理商 Jeanette S. Harms
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
Methods and apparatuses for preparing layouts and masks that use phase shifting to enable production of subwavelength features on an integrated circuit in close (optical) proximity to other structures are described. One embodiment selects from several strategies for resolving conflicts between phase shifters used to define features and (optically) proximate structures that are being defined other than by phase shifting. One embodiment adds additional phase shifters to define the conflicting structures. Another embodiment corrects the shape of the phase shifters in proximity to a conflicting structure. Resulting integrated circuits can include a greater number of subwavelength features even in areas that are in close proximity to structures that were not initially identified for production using a phase shifting mask.
公开/授权文献
- US20030056190A1 Alternating phase shift mask design conflict resolution 公开/授权日:2003-03-20
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