发明授权
- 专利标题: Low coherence interferometry utilizing phase
- 专利标题(中): 低相干干涉测量利用相位
-
申请号: US10845849申请日: 2004-05-14
-
公开(公告)号: US07184148B2公开(公告)日: 2007-02-27
- 发明人: Gerard A. Alphonse
- 申请人: Gerard A. Alphonse
- 申请人地址: US NJ Ewing
- 专利权人: Medeikon Corporation
- 当前专利权人: Medeikon Corporation
- 当前专利权人地址: US NJ Ewing
- 代理机构: Cantor Colburn LLP
- 主分类号: G01B9/02
- IPC分类号: G01B9/02
摘要:
A method for determining a characteristic of an analyte in a biological sample, the method comprising: directing broadband light by means of a sensing light path at the biological sample, at a target depth defined by the sensing light path and a reference light path; and receiving the broadband light reflected from the biological sample by means of the sensing light path. The method also includes: directing the broadband light by means of the reference light path at a reflecting device; receiving the broadband light reflected from the reflecting device by means of the reference light path; and interfering the broadband light reflected from the biological sample and the broadband light reflected from the reflecting device. The method further includes: detecting the broadband light resulting from interference of the broadband light reflected from the biological sample and the broadband light reflected from the reflecting device; and modulating an effective light path length of at least one of the reference light path and the sensing light path to enhance interference of the broadband light reflected from the biological sample and the broadband light reflected from the reflecting device. The method continues with: determining a magnitude of change of the effective light path length introduced by the modulating when interference is enhanced; determining a variation in an index of refraction from a ratio of the magnitude of change of the effective light path length and the target depth; and determining the characteristic of the analyte in the biological sample from the variation in the index of refraction.
公开/授权文献
- US20050254057A1 Low coherence interferometry utilizing phase 公开/授权日:2005-11-17
信息查询