发明授权
US07193229B2 Lithographic apparatus, illumination system and method for mitigating debris particles
有权
平版印刷设备,照明系统和减轻碎屑颗粒的方法
- 专利标题: Lithographic apparatus, illumination system and method for mitigating debris particles
- 专利标题(中): 平版印刷设备,照明系统和减轻碎屑颗粒的方法
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申请号: US11022943申请日: 2004-12-28
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公开(公告)号: US07193229B2公开(公告)日: 2007-03-20
- 发明人: Vadim Yevgenyevich Banine , Levinus Pieter Bakker , Aleksey Yurievich Kolesnychenko , Johannes Hubertus Josephina Moors , Frank Jeroen Pieter Schuurmans
- 申请人: Vadim Yevgenyevich Banine , Levinus Pieter Bakker , Aleksey Yurievich Kolesnychenko , Johannes Hubertus Josephina Moors , Frank Jeroen Pieter Schuurmans
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman, LLP
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
A lithographic apparatus includes a source for generating radiation, an illumination system for conditioning the radiation, a patterning device for patterning the conditioned radiation, and a projection system for projecting the patterned radiation onto a target portion of a substrate. The illumination system includes a debris mitigating system for mitigating debris particles that are released with the generation of radiation, and an optical system for collecting the radiation. The debris mitigation system is arranged to directly evaporate the debris particles, or to directly charge the debris particles, or to directly produce a plasma out of the debris particles, or any combination thereof, in a path along which the radiation propagates from the source to the optical system.
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