发明授权
US07201645B2 Contoured CMP pad dresser and associated methods 有权
轮廓CMP抛光修整器及相关方法

  • 专利标题: Contoured CMP pad dresser and associated methods
  • 专利标题(中): 轮廓CMP抛光修整器及相关方法
  • 申请号: US10954956
    申请日: 2004-09-29
  • 公开(公告)号: US07201645B2
    公开(公告)日: 2007-04-10
  • 发明人: Chien-Min Sung
  • 申请人: Chien-Min Sung
  • 代理机构: Thorpe North & Western, LLP
  • 主分类号: B24B21/18
  • IPC分类号: B24B21/18
Contoured CMP pad dresser and associated methods
摘要:
CMP pad dressers with increased pad dressing work loads on the centrally located abrasive particles during dressing of a CMP pad, and methods associated therewith are disclosed and described. The increase in work load on centralized particles improves pad dressing performance and also extends the service life of the pad dresser.
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