发明授权
US07202015B2 Positive photoresist composition and pattern making method using the same 有权
正光致抗蚀剂组合物和使用其的图案制造方法

Positive photoresist composition and pattern making method using the same
摘要:
A positive photoresist composition containing: (A) a resin which contains at least one of a repeating unit represented by the formula (IA) defiend herein and a repeating unit represented by the formula (IB) defined herein, and is decomposed by an action of an acid and shows an increase in a solubility in an alkali developer; and (B) as compounds capable of generating an acid upon irradiation with one of an actinic ray and a radiation, at least two compounds selected from the compounds (B1), (B2), (B3) and (B4) as defiend herein.
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