发明授权
- 专利标题: Lithographic apparatus and device manufacturing method
- 专利标题(中): 光刻设备和器件制造方法
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申请号: US11018927申请日: 2004-12-22
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公开(公告)号: US07202939B2公开(公告)日: 2007-04-10
- 发明人: Cheng-Qun Gui , Pieter Willem Herman De Jager , Robert-Han Munnig Schmidt
- 申请人: Cheng-Qun Gui , Pieter Willem Herman De Jager , Robert-Han Munnig Schmidt
- 申请人地址: NL
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL
- 代理机构: Sterne, Kessler, Goldstein & Fox PLLC
- 主分类号: G03B27/72
- IPC分类号: G03B27/72 ; G03B27/54 ; G03B27/42
摘要:
A lithographic apparatus comprises an illumination system for supplying a beam of radiation, a patterning arrangement incorporating an array of individually controllable elements for imparting a pattern to the beam cross-section, a substrate table for supporting a substrate, and a projection system incorporating a microlens array for projecting the beam onto a target portion of the substrate. An error compensator is provided for supplying error correction values for compensating for the effect of positional errors in the microlens array, and a grey scale modulator is provided for supplying drive signals to controllable elements of the patterning arrangement in dependence on the error correction values in order to compensate for the effect of positional errors in the microlens array by varying the intensity of some parts of the pattern relative to other parts of the pattern.
公开/授权文献
- US20060132750A1 Lithographic apparatus and device manufacturing method 公开/授权日:2006-06-22
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