发明授权
- 专利标题: Segmented MRAM memory array
- 专利标题(中): 分段MRAM存储器阵列
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申请号: US10780171申请日: 2004-02-16
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公开(公告)号: US07203129B2公开(公告)日: 2007-04-10
- 发明人: Wen-Chin Lin , Danny D. Tang , Li-Shyue Lai
- 申请人: Wen-Chin Lin , Danny D. Tang , Li-Shyue Lai
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: G11C8/00
- IPC分类号: G11C8/00
摘要:
In one example, an MRAM memory array includes a plurality of word lines, a plurality of bit lines crossing the word lines, and a plurality of first and second diodes, and magnetic tunnel junction memories. Each first diode includes a cathode, and an anode coupled to each bit line. Each second diode includes an anode, and a cathode coupled to each word line. The magnetic tunnel junction memories include a pinned layer, a free layer, and a non-magnetic layer. The non-magnetic layer is located between the pinned layer and the free layer. Each diode is positioned at crossing points of the bit lines and the word lines and connected between the first diode at the corresponding crossing bit line and the second diode at the corresponding crossing word line.
公开/授权文献
- US20050180203A1 Segmented MRAM memory array 公开/授权日:2005-08-18
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