Invention Grant
- Patent Title: Non-destructive testing system using a laser beam
- Patent Title (中): 使用激光束的非破坏性测试系统
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Application No.: US10301030Application Date: 2002-11-20
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Publication No.: US07206078B2Publication Date: 2007-04-17
- Inventor: Paul Pfaff , Michael Mauck
- Applicant: Paul Pfaff , Michael Mauck
- Applicant Address: US OR Lake Oswego
- Assignee: Attofemto, Inc.
- Current Assignee: Attofemto, Inc.
- Current Assignee Address: US OR Lake Oswego
- Agency: Davis Wright Tremaine LLP
- Agent George C. Rondeau, Jr.
- Main IPC: G01N21/24
- IPC: G01N21/24 ; G01N21/43

Abstract:
A noninvasive testing system using a method of testing a device under test by providing a beam of light from a light source having a first wavelength, and in a first beam instance imposing the beam of light on a test device when the test device has a first state of refractive indexes, and in a second beam instance imposing the beam of light on the test device when the test device has a second state of refractive indexes, in both instances the beam of light being imposed on the test device over a spatial region within the test device substantially greater than the first wavelength. Data resulting from the interference of the first beam instance and the second beam instance within the device under test is obtained representative of the voltages within the region. The first state of refractive indexes is at a first voltage potential, and the second state of refractive indexes is at a second voltage potential different from the first voltage potential.
Public/Granted literature
- US20050231733A1 Non-destructive testing system Public/Granted day:2005-10-20
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