Invention Grant
- Patent Title: Columnar 1T-N memory cell structure
- Patent Title (中): 柱状1T-N存储单元结构
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Application No.: US10925243Application Date: 2004-08-25
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Publication No.: US07209378B2Publication Date: 2007-04-24
- Inventor: Hasan Nejad , Mirmajid Seyyedy
- Applicant: Hasan Nejad , Mirmajid Seyyedy
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A memory array architecture incorporates certain advantages from both cross-point and 1T-1Cell architectures during reading operations. The fast read-time and higher signal to noise ratio of the 1T-1Cell architecture and the higher packing density of the cross-point architecture are both exploited by using a single access transistor to control the reading of multiple stacked columns of memory cells, each column being provided in a respective stacked memory layer.
Public/Granted literature
- US20050162883A1 Columnar 1T-nMemory cell structure and its method of formation and operation Public/Granted day:2005-07-28
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