发明授权
- 专利标题: Deflector of a micro-column electron beam apparatus and method for fabricating the same
- 专利标题(中): 微柱电子束装置的偏转器及其制造方法
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申请号: US10853519申请日: 2004-05-26
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公开(公告)号: US07214117B2公开(公告)日: 2007-05-08
- 发明人: Sang Kuk Choi , Dae Yong Kim , Dong Yel Kang
- 申请人: Sang Kuk Choi , Dae Yong Kim , Dong Yel Kang
- 申请人地址: KR Daejon-shi
- 专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人: Electronics and Telecommunications Research Institute
- 当前专利权人地址: KR Daejon-shi
- 代理机构: Lowe Hauptman & Berner LLP
- 优先权: KR2002-72975 20021122
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
The present invention relates to a deflector of a micro-column electron beam apparatus and method for fabricating the same, which forms a seed metal layer and a mask layer on both sides of a substrate, and exposes some of the seed metal layer on which deflecting plates, wirings and pads are to be formed by lithography process using a predetermined mask. The wirings and pads are formed by plating metal on the exposed portion, and some of the metal layer is also exposed on which the deflecting plates are to be formed using a predetermined mask, and then the metal is plated with desired thickness, thereby the deflecting plates are completed. Therefore, by forming plurality of deflecting plates on both sides of the substrate at the same time through plating process, alignment between the deflecting plates formed on both sides of the substrate can be exactly made, and by fabricating a deflector integrated with the substrate and deflecting plates in a batch process, productivity and reproducibility is improved. In addition, since the deflecting plates, wirings and pads are directly formed on the substrate, structural safety is improved and thereby durability is also improved.
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