Invention Grant
US07215422B2 Assembly and method for wavelength calibration in an echelle spectrometer
有权
在梯形光谱仪中进行波长校准的装配和方法
- Patent Title: Assembly and method for wavelength calibration in an echelle spectrometer
- Patent Title (中): 在梯形光谱仪中进行波长校准的装配和方法
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Application No.: US10503636Application Date: 2003-01-28
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Publication No.: US07215422B2Publication Date: 2007-05-08
- Inventor: Stefan Florek , Helmut Becker-Ross , Uwe Heitmann
- Applicant: Stefan Florek , Helmut Becker-Ross , Uwe Heitmann
- Applicant Address: DE Dortmund DE Berlin
- Assignee: Gesellschaft zur Förderung der Analytischen Wissenschaften e.V.,Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskonie e. V.
- Current Assignee: Gesellschaft zur Förderung der Analytischen Wissenschaften e.V.,Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskonie e. V.
- Current Assignee Address: DE Dortmund DE Berlin
- Agent James Creighton Wray
- Priority: DE10205142 20020207
- International Application: PCT/EP03/00832 WO 20030128
- International Announcement: WO03/067204 WO 20030814
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
A spectrometer assembly (10) is disclosed. The assembly includes a light source (11) with a continuous spectrum. A pre-monochromator (2) generates a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of the spectral portion being smaller than or equal to the bandwidth of the free spectral range of the order in the echelle spectrum. The centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency. The assembly also includes an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra.
Public/Granted literature
- US20050157293A1 Assembly and method for wavelength calibration in an echelle spectrometer Public/Granted day:2005-07-21
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