发明授权
- 专利标题: Position detecting method and apparatus
- 专利标题(中): 位置检测方法和装置
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申请号: US10664998申请日: 2003-09-18
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公开(公告)号: US07229566B2公开(公告)日: 2007-06-12
- 发明人: Takahiro Matsumoto , Hideki Ina
- 申请人: Takahiro Matsumoto , Hideki Ina
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Morgan & Finnegan, L.L.P.
- 优先权: JP2002-275824 20020920
- 主分类号: G01B11/00
- IPC分类号: G01B11/00
摘要:
A two-dimensional image of an alignment mark 30 is acquired by an alignment scope 15 at step S61, and the two-dimensional image acquired at step S61 is converted to a light-intensity signal line by line at step S62. A selection as to whether each line signal is valid or unnecessary is made at step S63. The amount of positional deviation of the alignment mark 30 is calculated using only valid line signals at step S64.
公开/授权文献
- US20040058540A1 Position detecting method and apparatus 公开/授权日:2004-03-25
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