Invention Grant
- Patent Title: Connector test device
- Patent Title (中): 连接器测试装置
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Application No.: US11281150Application Date: 2005-11-17
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Publication No.: US07230433B2Publication Date: 2007-06-12
- Inventor: Il Kim
- Applicant: Il Kim
- Applicant Address: KR Seoul
- Assignee: Hyundai Motor Company
- Current Assignee: Hyundai Motor Company
- Current Assignee Address: KR Seoul
- Agency: Morgan Lewis & Bockius LLP
- Priority: KR10-2004-0094085 20041117
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
The present invention provides a connector test device. The device includes a test jig which has a conductive test pin to detect whether a conductive pin of a connector is appropriately connected to the conductive test pin or not, and a moving pin and a test terminal to detect whether a waterproof pin of the connector is appropriately installed in the connector or not. The device simultaneously displays the electricity conduction states between the conductive pin and the conductive test pin and between the moving pin and the test terminal. The device easily and accurately measures the installed states of both the conductive pin and the waterproof pin provided in the connector.
Public/Granted literature
- US20060105604A1 Connector test device Public/Granted day:2006-05-18
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