发明授权
- 专利标题: Method for measuring gap of liquid crystal cell
- 专利标题(中): 测量液晶盒间隙的方法
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申请号: US10470015申请日: 2001-02-09
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公开(公告)号: US07230713B2公开(公告)日: 2007-06-12
- 发明人: Tomohiro Akada , Masaya Takizawa
- 申请人: Tomohiro Akada , Masaya Takizawa
- 申请人地址: JP Osaka
- 专利权人: Otsuka Electronics Co., Ltd.
- 当前专利权人: Otsuka Electronics Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 国际申请: PCT/JP01/00921 WO 20010209
- 国际公布: WO02/065053 WO 20020822
- 主分类号: G01N21/55
- IPC分类号: G01N21/55 ; G01B11/28 ; G01B11/06
摘要:
The polarization angle θ1 of a polarizer (14) is set, and the reflection intensity S1 in a cross Nicol state and the reference reflection intensity Ref1 of a liquid crystal cell (15) are measured. A different polarization angle θ2 is then set, and the reflection intensity S2 in a cross Nicol state and the reference reflection intensity Ref2 of the liquid crystal cell are measured. The rations S1/Ref1, S2/Ref2 of measured intensities and the ratio S1·Ref2/S2·Ref1 is determined in order to cancel the background components of the reference reflection intensities Ref1, Ref2 thus determining the value of cell gap accurately.
公开/授权文献
- US20040233432A1 Method for measuring gap of liquid crystal cell 公开/授权日:2004-11-25
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