发明授权
- 专利标题: Eddy current testing probe and eddy current testing apparatus
- 专利标题(中): 涡流测试探头和涡流测试仪
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申请号: US11326510申请日: 2006-01-06
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公开(公告)号: US07235967B2公开(公告)日: 2007-06-26
- 发明人: Akira Nishimizu , Tetsuya Matsui , Masahiro Koike , Yoshio Nonaka , Isao Yoshida
- 申请人: Akira Nishimizu , Tetsuya Matsui , Masahiro Koike , Yoshio Nonaka , Isao Yoshida
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly, Stanger, Malur & Brundidge, P.C.
- 优先权: JP2005-004898 20050112
- 主分类号: G01R33/12
- IPC分类号: G01R33/12
摘要:
An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.
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