利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

49 条记录 (耗时 0.026 秒)

    Eddy current testing probe and eddy current testing apparatus
    1.
    发明授权
    Eddy current testing probe and eddy current testing apparatus 有权
    涡流测试探头和涡流测试仪

    公开(公告)号：US07235967B2

    公开(公告)日：2007-06-26

    申请号：US11326510

    申请日：2006-01-06

    申请人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    发明人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    IPC分类号： G01R33/12

    CPC分类号： G01N27/9013 ,  G01N27/904

    摘要： An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.

    摘要翻译： 涡流测试探针具有适于面向测试物品的表面的柔性基底，多个线圈，其固定到柔性基底并被激励，其中一个可以顺序地改变;用于按压基底的按压部件 朝向测试物品，布置在基底和按压构件之间的弹性构件和用于限制按压构件朝向测试物品移动的移动限制构件。

    Eddy current testing probe and eddy current testing apparatus
    2.
    发明申请
    Eddy current testing probe and eddy current testing apparatus 有权
    涡流测试探头和涡流测试仪

    公开(公告)号：US20060170420A1

    公开(公告)日：2006-08-03

    申请号：US11326510

    申请日：2006-01-06

    申请人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    发明人： Akira Nishimizu ,  Tetsuya Matsui ,  Masahiro Koike ,  Yoshio Nonaka ,  Isao Yoshida

    IPC分类号： G01R33/12

    CPC分类号： G01N27/9013 ,  G01N27/904

    摘要： An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.

    摘要翻译： 涡流测试探针具有适于面向测试物品的表面的柔性基底，多个线圈，其固定到柔性基底并被激励，其中一个可以顺序地改变;用于按压基底的按压部件 朝向测试物品，布置在基底和按压构件之间的弹性构件和用于限制按压构件朝向测试物品移动的移动限制构件。

    Ultrasonic flaw detecting method and ultrasonic flaw detector
    7.
    发明申请
    Ultrasonic flaw detecting method and ultrasonic flaw detector 有权
    超声波探伤法和超声波探伤仪

    公开(公告)号：US20050183505A1

    公开(公告)日：2005-08-25

    申请号：US11049949

    申请日：2005-02-04

    申请人： Naoyuki Kono ,  Tetsuya Matsui ,  Masahiro Koike ,  Masahiro Tooma ,  Yoshinori Musha ,  Masahiro Miki

    发明人： Naoyuki Kono ,  Tetsuya Matsui ,  Masahiro Koike ,  Masahiro Tooma ,  Yoshinori Musha ,  Masahiro Miki

    IPC分类号： G01N29/04 ,  G01N29/07 ,  G01N29/26

    CPC分类号： G01N29/262 ,  G01N29/07 ,  G01N2291/0232 ,  G01N2291/0421 ,  G01N2291/0422 ,  G01N2291/106

    摘要： In order to make it possible in ultrasonic flaw detection to generate ultrasonic waves containing a main beam only by use of an array probe and clearly identify a defect in a specimen by use of images, an element pitch P (the distance between centers of adjacent ultrasonic transducer elements in the array probe) is set longer than ¼ of the wavelength of longitudinal waves generated by the ultrasonic transducer elements and shorter than ½ of the wavelength and reception signals up to time corresponding to the sum of wall thickness round-trip propagation time for longitudinal waves and wall thickness round-trip propagation time for shear waves in the specimen are displayed.

    摘要翻译： 为了在超声波探伤中可以通过使用阵列探针产生包含主光束的超声波，并通过使用图像清楚地识别样本中的缺陷，元素间距P（相邻超声波中心之间的距离 阵列探头中的换能器元件）被设置为比由超声换能器元件产生的纵波的波长的1/4，并且短于对应于壁厚往返传播时间之和的波长和接收信号的1/2的一半 显示样品中剪切波的纵波和壁厚往返传播时间。