发明授权
- 专利标题: Photodetector
- 专利标题(中): 光电检测器
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申请号: US11129787申请日: 2005-05-16
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公开(公告)号: US07238972B2公开(公告)日: 2007-07-03
- 发明人: Ming-Lum Lee , Wei-Chih Lai , Shih-Chang Shei
- 申请人: Ming-Lum Lee , Wei-Chih Lai , Shih-Chang Shei
- 申请人地址: TW Tainan County
- 专利权人: Epitech Technology Corporation
- 当前专利权人: Epitech Technology Corporation
- 当前专利权人地址: TW Tainan County
- 代理机构: Thomas, Kayden, Horstemeyer & Risley
- 优先权: TW94111235A 20050408
- 主分类号: H01L31/0328
- IPC分类号: H01L31/0328 ; H01L31/0336 ; H01L31/072 ; H01L31/109 ; H01L29/732
摘要:
A photodetector is described. The photodetector is comprised of a substrate, a first n-type III-V compound semiconductor layer located on the substrate, an n++-type III-V compound semiconductor layer located on a first portion of the first n-type III-V compound semiconductor layer with a second portion of the first n-type III-V compound semiconductor layer exposed, a p-type III-V compound semiconductor layer located on the n++-type compound semiconductor layer, an undoped III-V compound semiconductor layer located on the p-type III-V compound semiconductor layer, a second n-type III-V compound semiconductor layer located on the undoped III-V compound semiconductor layer, a conductive transparent oxide layer located on the second n-type III-V compound semiconductor layer, a first electrode located on a portion of the conductive transparent oxide layer, and a second electrode located on a portion of the second portion of the first n-type III-V compound semiconductor layer.
公开/授权文献
- US20060226417A1 Photodetector 公开/授权日:2006-10-12
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