Invention Grant
US07239395B2 Optical interrogation systems with reduced parasitic reflections and a method for filtering parasitic reflections 有权
具有减少的寄生反射的光学询问系统和用于滤除寄生反射的方法

  • Patent Title: Optical interrogation systems with reduced parasitic reflections and a method for filtering parasitic reflections
  • Patent Title (中): 具有减少的寄生反射的光学询问系统和用于滤除寄生反射的方法
  • Application No.: US10856572
    Application Date: 2004-05-27
  • Publication No.: US07239395B2
    Publication Date: 2007-07-03
  • Inventor: Jacques Gollier
  • Applicant: Jacques Gollier
  • Applicant Address: US NY Corning
  • Assignee: Corning Incorporated
  • Current Assignee: Corning Incorporated
  • Current Assignee Address: US NY Corning
  • Agent Svetlana Z. Short
  • Main IPC: G01N21/55
  • IPC: G01N21/55 G01J4/00
Optical interrogation systems with reduced parasitic reflections and a method for filtering parasitic reflections
Abstract:
According to one aspect of the present invention the optical interrogation system comprises: (i) an optical sensor capable of immobilizing biological, bio-chemical and/or chemical substance; and (ii) an optical isolator that filters and eliminates parasitic reflections introduced by the optical sensor. In some embodiments the optical sensor includes a GCW with a surface having a sensing region capable of immobilizing biological, bio-chemical or chemical substances includes, and the optical interrogation system includes an optical detection system for monitoring this sensing region, the optical detection system comprising a light source, an optical delivery system, and a detection instrument.
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