Invention Grant
- Patent Title: Device for high-accuracy measurement of dimensional changes
- Patent Title (中): 用于高精度测量尺寸变化的装置
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Application No.: US10900484Application Date: 2004-07-27
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Publication No.: US07239397B2Publication Date: 2007-07-03
- Inventor: Vivek G. Badami , Steven R. Patterson
- Applicant: Vivek G. Badami , Steven R. Patterson
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent Timothy M. Schaeberle
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
Thermal expansion characteristics of test materials of ultra-low thermal expansion material are measured with a test beam that is split into a test material-measuring portion and an instrument-measuring portion. Both measuring portions propagate through common portions of a test arm. The test material-measuring portion encounters a test material, but the instrument-measuring portion does not. Thermal expansion characteristics of the test material are measured to high accuracy by manipulating the measures to distinguish displacements associated with the test material from displacements associated with the instrument structure.
Public/Granted literature
- US20050140983A1 Device for high-accuracy measurement of dimensional changes Public/Granted day:2005-06-30
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