A method to detect frequency and angle of a binary halftone pattern. The method employs an exclusive-or operation which is applied locally to a region of a binary bit map and its spatially shifted version. The resulting bits from the exclusive-or operation are summed over the region. The exclusive-or operation is repeated for a range of shift values. In a halftone region, the shift at which the minimum sum occurs reflects the angle and the frequency of the halftone.