Invention Grant
- Patent Title: Trigger probe for determining the orientation of the power distribution of an electron beam
- Patent Title (中): 用于确定电子束功率分布取向的触发探头
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Application No.: US11158481Application Date: 2005-06-21
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Publication No.: US07244950B2Publication Date: 2007-07-17
- Inventor: John W. Elmer , Todd A. Palmer , Alan T. Teruya
- Applicant: John W. Elmer , Todd A. Palmer , Alan T. Teruya
- Applicant Address: US CA Oakland
- Assignee: The Regents of the University of California
- Current Assignee: The Regents of the University of California
- Current Assignee Address: US CA Oakland
- Agent Michael C. Staggs; John H. Lee
- Main IPC: G01N27/00
- IPC: G01N27/00

Abstract:
The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.
Public/Granted literature
- US20060038139A1 Trigger probe for determining the orientation of the power distribution of an electron beam Public/Granted day:2006-02-23
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