Invention Grant
US07244950B2 Trigger probe for determining the orientation of the power distribution of an electron beam 有权
用于确定电子束功率分布取向的触发探头

Trigger probe for determining the orientation of the power distribution of an electron beam
Abstract:
The present invention relates to a probe for determining the orientation of electron beams being profiled. To accurately time the location of an electron beam, the probe is designed to accept electrons from only a narrowly defined area. The signal produced from the probe is then used as a timing or triggering fiducial for an operably coupled data acquisition system. Such an arrangement eliminates changes in slit geometry, an additional signal feedthrough in the wall of a welding chamber and a second timing or triggering channel on a data acquisition system. As a result, the present invention improves the accuracy of the resulting data by minimizing the adverse effects of current slit triggering methods so as to accurately reconstruct electron or ion beams.
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