发明授权
- 专利标题: Selective etching method
- 专利标题(中): 选择性蚀刻方法
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申请号: US10839990申请日: 2004-05-06
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公开(公告)号: US07247247B2公开(公告)日: 2007-07-24
- 发明人: Jerwei Hsieh , Huai-Yuan Chu , Julius Ming-Lin Tsai , Weileun Fang
- 申请人: Jerwei Hsieh , Huai-Yuan Chu , Julius Ming-Lin Tsai , Weileun Fang
- 申请人地址: TW Taipei
- 专利权人: Walsin Lihwa Corporation
- 当前专利权人: Walsin Lihwa Corporation
- 当前专利权人地址: TW Taipei
- 代理机构: Volpe and Koenig, P.C.
- 优先权: TW92112374A 20030506
- 主分类号: B81C1/00
- IPC分类号: B81C1/00
摘要:
A selective etching method with lateral protection function is provided. The steps includes: (a) providing a substrate; (b) forming a plurality of tunnels; (c) forming a lateral strengthening structure at a peripheral wall of the tunnels; (d) removing a bottom portion of the lateral strengthening structure, and a part of the substrate by an etching process so as to form a lower structure and expose an unstrengthened structure; and (f) etching the unstrengthened structure laterally so as to form an upper structure.
公开/授权文献
- US20040232110A1 Selective etching method 公开/授权日:2004-11-25
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