Invention Grant
- Patent Title: Probe card and method for producing the same
- Patent Title (中): 探针卡及其制作方法
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Application No.: US11287455Application Date: 2005-11-28
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Publication No.: US07248064B2Publication Date: 2007-07-24
- Inventor: Dai-Gil Lee , Seong-Su Kim , Byung-Chul Kim , Dong-Chang Park
- Applicant: Dai-Gil Lee , Seong-Su Kim , Byung-Chul Kim , Dong-Chang Park
- Applicant Address: KR Daejeon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejeon
- Agency: Lowe Hauptman & Berner
- Priority: KR10-2005-0031100 20050414
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A probe card is used in conducting a visual test for a target test object through simultaneous contact of the probe card with each and every electrode pad of the target test object. The probe card includes a plurality of probes composed of conductive wire strands and having elastically deformable contact parts so curved as to make contact with electrode pads of a target test object. The contact parts are oriented in one and the same direction and extend in a parallel relationship with one another. The probe card further includes a first insulating block for fixedly securing one end parts of the probes, a second insulating block for fixedly securing the other end parts of the probes and a mounting plate for holding the first and second insulating blocks in such a manner that the contact parts of the probes protrude outwardly.
Public/Granted literature
- US20060232286A1 Probe card and method for producing the same Public/Granted day:2006-10-19
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