Invention Grant
- Patent Title: System for inspecting uniformity of tire
- Patent Title (中): 检查轮胎均匀性的系统
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Application No.: US10530714Application Date: 2003-10-08
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Publication No.: US07249496B2Publication Date: 2007-07-31
- Inventor: Hiroki Kunitake , Takahiro Gotou , Yoshihiro Murota , Yoshiaki Hirata
- Applicant: Hiroki Kunitake , Takahiro Gotou , Yoshihiro Murota , Yoshiaki Hirata
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Bridgestone
- Current Assignee: Kabushiki Kaisha Bridgestone
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2002-296361 20021009
- International Application: PCT/JP03/12874 WO 20031008
- International Announcement: WO2004/033191 WO 20040422
- Main IPC: G01M17/02
- IPC: G01M17/02

Abstract:
An uniformity inspection line 1 comprises a decision-only line 2 having first UF machines 2M exclusive for the measurement of the uniformity of a tire 12 sorted and distributed on an automatic sorting line 21 and a correction-only line 3 having second UF machines 3M for the correction and re-measurement of the uniformity characteristics of a tire having uniformity characteristics outside specific values measured on the above decision-only line 2. Since the measurement of uniformity and the correction and re-measurement of uniformity characteristics are performed in different systems, uniformity inspection can be carried out efficiently even when the number of tires whose uniformity characteristics are to be corrected is varied.
Public/Granted literature
- US20060090557A1 System for inspecting uniformity of tire Public/Granted day:2006-05-04
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