发明授权
- 专利标题: Rare earth element-doped silicon/silicon dioxide lattice structure
- 专利标题(中): 稀土元素掺杂硅/二氧化硅晶格结构
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申请号: US11039463申请日: 2005-01-19
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公开(公告)号: US07256426B2公开(公告)日: 2007-08-14
- 发明人: Tingkai Li , Wei Gao , Yoshi Ono , Sheng Teng Hsu
- 申请人: Tingkai Li , Wei Gao , Yoshi Ono , Sheng Teng Hsu
- 申请人地址: US WA Camas
- 专利权人: Sharp Laboratories of America, Inc.
- 当前专利权人: Sharp Laboratories of America, Inc.
- 当前专利权人地址: US WA Camas
- 代理机构: Law Office of Gerald Maliszewski
- 代理商 Gerald Maliszewski
- 主分类号: H01L27/15
- IPC分类号: H01L27/15 ; H01L21/00
摘要:
Provided are an electroluminescence (EL) device and corresponding method for forming a rare earth element-doped silicon (Si)/Si dioxide (SiO2) lattice structure. The method comprises: providing a substrate; DC sputtering a layer of amorphous Si overlying the substrate; DC sputtering a rare earth element; in response, doping the Si layer with the rare earth element; DC sputtering a layer of SiO2 overlying the rare earth-doped Si; forming a lattice structure; annealing; and, in response to the annealing, forming nanocrystals in the rare-earth doped Si having a grain size in the range of 1 to 5 nanometers (nm). In one aspect, the rare earth element and Si are co-DC sputtered. Typically, the steps of DC sputtering Si, DC sputtering the rare earth element, and DC sputtering the SiO2 are repeated 5 to 60 cycles, so that the lattice structure includes the plurality (5-60) of alternating SiO2 and rare earth element-doped Si layers.
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