发明授权
- 专利标题: Method for testing pixels for LCD TFT displays
- 专利标题(中): LCD TFT显示器像素测试方法
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申请号: US10977510申请日: 2004-10-29
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公开(公告)号: US07256606B2公开(公告)日: 2007-08-14
- 发明人: Axel Wenzel , Ralf Schmid , Matthias Brunner
- 申请人: Axel Wenzel , Ralf Schmid , Matthias Brunner
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson & Sheridan LLP
- 主分类号: G01R31/00
- IPC分类号: G01R31/00 ; G01R31/307
摘要:
The present invention provides a method of electron beam testing of liquid crystal displays comprising non-uniform electrodes having a conductive portion and a dielectric portion. In accordance with methods of the present invention, the diameter of the electron beam is increased so that the beam is less focused, i.e., enlarged or “blurred,” over a non-uniform electrode area. The diameter of the beam is increased so that the beam generates secondary electrons from the conductive portion of the non-uniform electrode area. The configured test beam may be circular, elliptical, or other suitable shapes.
公开/授权文献
- US20060028230A1 Method for testing pixels for LCD TFT displays 公开/授权日:2006-02-09