Invention Grant
US07266029B2 Nonvolatile memory devices including overlapped data sensing and verification and methods of verifying data in nonvolatile memory devices 有权
包括重叠数据传感和验证的非易失性存储器件以及在非易失性存储器件中验证数据的方法

  • Patent Title: Nonvolatile memory devices including overlapped data sensing and verification and methods of verifying data in nonvolatile memory devices
  • Patent Title (中): 包括重叠数据传感和验证的非易失性存储器件以及在非易失性存储器件中验证数据的方法
  • Application No.: US11017335
    Application Date: 2004-12-20
  • Publication No.: US07266029B2
    Publication Date: 2007-09-04
  • Inventor: Jae-Yong Jeong
  • Applicant: Jae-Yong Jeong
  • Agency: Myers Bigel Sibley & Sajovec
  • Priority: KR10-2004-0077925 20040930
  • Main IPC: G11C7/02
  • IPC: G11C7/02
Nonvolatile memory devices including overlapped data sensing and verification and methods of verifying data in nonvolatile memory devices
Abstract:
Data verification methods and/or nonvolatile memory devices are provided that concurrently detect data for a selected memory cell of the nonvolatile memory device and verify a programmed or erase state of previously detected data of a different memory cell of the nonvolatile memory device. Concurrently detecting data and verifying a programmed or erase state may be provided by a sense amplifier configured to sense data from a memory cell of the nonvolatile memory device, a latch configured to store the data sensed by the sense amplifier, an I/O buffer configured to store the data stored in the latch and a program/erase verifier circuit configured to control the sense amplifier, latch and I/O buffer to provided previously sensed data for a first memory cell to the program erase/verifier circuit for verification while the sense amplifier is sensing data for a second memory cell.
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