发明授权
- 专利标题: Wear monitoring system with embedded conductors
- 专利标题(中): 带嵌入式导体的磨损监测系统
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申请号: US11018816申请日: 2004-12-20
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公开(公告)号: US07270890B2公开(公告)日: 2007-09-18
- 发明人: Stephen M. Sabol , Ramesh Subramanian
- 申请人: Stephen M. Sabol , Ramesh Subramanian
- 申请人地址: US FL Orlando
- 专利权人: Siemens Power Generation, Inc.
- 当前专利权人: Siemens Power Generation, Inc.
- 当前专利权人地址: US FL Orlando
- 主分类号: B32B9/00
- IPC分类号: B32B9/00
摘要:
Aspects of the invention relate to a system for monitoring the wear of a component. A conductor can be embedded in the component at a depth from a surface of the component. In one embodiment, the conductor can be operatively connected to a power source to form an electrical circuit. The resistance across the conductor can be measured. As the component contacts a second component, the component can begin to wear. Once the wear progresses to the conductor, changes in the measured resistance can result. Thus, an operator can be alerted that the component has worn to a certain point and that service may be needed. Alternatively, impedance can be measured across the conductor. Because the dielectric permeability of the material surrounding the conductor can affect impedance, changes in impedance can occur as the surface material of the component is worn away.
公开/授权文献
- US20050158511A1 Wear monitoring system with embedded conductors 公开/授权日:2005-07-21
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