发明授权
- 专利标题: Magnetic characteristic inspecting apparatus and inspecting method using it
- 专利标题(中): 磁性检测装置及使用方法的检查方法
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申请号: US11272861申请日: 2005-11-15
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公开(公告)号: US07276900B2公开(公告)日: 2007-10-02
- 发明人: Masayoshi Takahashi , Masami Makuuchi , Ritsuro Orihashi , Shinji Homma
- 申请人: Masayoshi Takahashi , Masami Makuuchi , Ritsuro Orihashi , Shinji Homma
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2004-370780 20041222
- 主分类号: G01R33/12
- IPC分类号: G01R33/12
摘要:
A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or allocating the read signals to measurement resources, and a unit for selecting any of the disk rotating devices synchronously with which the measurement resources will perform measurement. The write signal production units and measurement resources are shared among inspections of the plurality of disk rotating devices or the plurality of heads.
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