发明授权
- 专利标题: Manufacturing method and apparatus of phase shift mask blank
- 专利标题(中): 相移掩模空白的制造方法和装置
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申请号: US10821508申请日: 2004-04-09
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公开(公告)号: US07282121B2公开(公告)日: 2007-10-16
- 发明人: Osamu Nozawa , Hideaki Mitsui
- 申请人: Osamu Nozawa , Hideaki Mitsui
- 申请人地址: JP
- 专利权人: Hoya Corporation
- 当前专利权人: Hoya Corporation
- 当前专利权人地址: JP
- 代理机构: Cook, Alex, McFarron, Manzo, Cummings & Mehler, Ltd.
- 优先权: JP2000-277354 20000912
- 主分类号: C23C14/34
- IPC分类号: C23C14/34
摘要:
There is disclosed a manufacturing method of a phase shift mask blank in which dispersions of phase angle and transmittance among blanks can be reduced as much as possible and yield is satisfactory. In the manufacturing method of the phase shift mask blank, a process of using a sputtering method to continuously form a thin film on a transparent substrate comprises: successively subjecting a plurality of substrates to a series of process of supplying the transparent substrate into a sputtering chamber, forming the thin film for forming a pattern in the sputtering chamber, and discharging the transparent substrate with the film formed thereon from the sputtering chamber; supplying and discharging the transparent substrate substantially at a constant interval; and setting a film formation time to be constant among a plurality of blanks.
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