Invention Grant
- Patent Title: Externally-loaded weighted random test pattern compression
- Patent Title (中): 外部负荷加权随机测试模式压缩
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Application No.: US10891618Application Date: 2004-07-15
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Publication No.: US07284176B2Publication Date: 2007-10-16
- Inventor: Seongmoon Wang , Srimat T. Chakradhar
- Applicant: Seongmoon Wang , Srimat T. Chakradhar
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06F17/50
Abstract:
The present invention is directed to a logic testing architecture with an improved decompression engine and a method of decompressing scan chains for testing logic circuits.
Public/Granted literature
- US20060015787A1 Externally-loaded weighted random test pattern compression Public/Granted day:2006-01-19
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