发明授权
- 专利标题: Automatic test equipment operating architecture
- 专利标题(中): 自动测试设备操作架构
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申请号: US11383972申请日: 2006-05-18
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公开(公告)号: US07302358B2公开(公告)日: 2007-11-27
- 发明人: William A. Fritzsche
- 申请人: William A. Fritzsche
- 申请人地址: US CA Milpitas
- 专利权人: Credence Systems Solutions
- 当前专利权人: Credence Systems Solutions
- 当前专利权人地址: US CA Milpitas
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
An integrated circuit testing device, such as an ATE, configured with an architecture comprising a distinct software layer and a distinct hardware layer with an interface for tester abstraction providing a communication conduit between the software layer and the hardware layer. The software layer communicates in device under test terms whereas the hardware layer communicates in the terms of the testing apparatus. Various communication interface points are provided to the software and hardware layers, as well as the interface for tester abstraction.
公开/授权文献
- US20060212254A1 AUTOMATIC TEST EQUIPMENT OPERATING ARCHITECTURE 公开/授权日:2006-09-21
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