发明授权
- 专利标题： Three dimensional analyzing device
- 专利标题（中）： 三维分析装置
-
申请号： US11404248申请日： 2006-04-13
-
公开(公告)号： US07304315B2公开(公告)日： 2007-12-04
- 发明人: Yoshinori Iketaki , Masaaki Fujii , Takeshi Watanabe , Takashige Omatsu , Kimihisa Yamamoto , Toshio Suzuki
- 申请人： Yoshinori Iketaki , Masaaki Fujii , Takeshi Watanabe , Takashige Omatsu , Kimihisa Yamamoto , Toshio Suzuki
- 申请人地址： JP Kawaguchi-shi JP Tokyo JP Tokyo
- 专利权人： Japan Science & Technology Agency,Olympus Corporation,Nippon Roper Co., Ltd.
- 当前专利权人： Japan Science & Technology Agency,Olympus Corporation,Nippon Roper Co., Ltd.
- 当前专利权人地址： JP Kawaguchi-shi JP Tokyo JP Tokyo
- 代理机构： Frishauf, Holtz, Goodman & Chick, P.C.
- 优先权： JP2003-355327 20031015
- 主分类号： G01N21/64
- IPC分类号： G01N21/64 ; G01J3/00
摘要：
A three-dimensional analyzing device includes a first beam source for generating a first beam, a second beam source for generating a second beam, an optical system for spatially overlapping the first and second beams at least partly and irradiating the beams onto a specimen to three-dimensionally confine a photoactive region in a specimen, and a photo acceptance element for accepting a response light emitted from the photoactive region. Preferably, the device further includes an operation unit for calculating a correlation function of a response light in the time domain based on the output of the photo acceptance element to analyze a desired physical value of the specimen.
公开/授权文献
- US20060290924A1 Three dimensional analyzing device 公开/授权日：2006-12-28
信息查询
