发明授权
US07310754B2 Integrated test circuit, a test circuit, and a test method for performing transmission and reception processing to and from a first and a second macro block at a first frequency 有权
集成测试电路,测试电路和测试方法,用于以第一频率对第一和第二宏块执行发送和接收处理

  • 专利标题: Integrated test circuit, a test circuit, and a test method for performing transmission and reception processing to and from a first and a second macro block at a first frequency
  • 专利标题(中): 集成测试电路,测试电路和测试方法,用于以第一频率对第一和第二宏块执行发送和接收处理
  • 申请号: US10766038
    申请日: 2004-01-29
  • 公开(公告)号: US07310754B2
    公开(公告)日: 2007-12-18
  • 发明人: Haruo NishidaTakuya Ishida
  • 申请人: Haruo NishidaTakuya Ishida
  • 申请人地址: JP Tokyo
  • 专利权人: Seiko Epson Corporation
  • 当前专利权人: Seiko Epson Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Oliff & Berridge, PLC
  • 优先权: JP2003-022274 20030130
  • 主分类号: G01R31/28
  • IPC分类号: G01R31/28
Integrated test circuit, a test circuit, and a test method for performing transmission and reception processing to and from a first and a second macro block at a first frequency
摘要:
A macro block MB2 including a physical-layer circuit PHY for communications performs transmission and reception processing to and from a macro block MB1 at a clock frequency CF1. A test circuit TC includes a test transmission buffer TXB that stores a transmission data signal from a test input terminal TPI at a frequency CF2 that is lower than the frequency CF1, and a test reception buffer RXB that outputs a reception data signal to a test output terminal TPO at a frequency CF3 that is lower than the frequency CF1. After the transmission buffer TXB has stored the transmission data signal from the terminal TPI at the frequency CF2, it outputs the stored transmission data signal to the MB2 at the frequency CF1. After the reception buffer RXB has stored the reception data signal from the MB2 at the frequency CF1, it outputs the stored reception data signal to the terminal TPO at the frequency CF3.
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