发明授权
US07313747B2 Measuring microprocessor susceptibility to internal noise generation
失效
测量微处理器对内部噪声产生的敏感性
- 专利标题： Measuring microprocessor susceptibility to internal noise generation
- 专利标题（中）： 测量微处理器对内部噪声产生的敏感性
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申请号： US11388002申请日： 2006-03-23
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公开(公告)号： US07313747B2公开(公告)日： 2007-12-25
- 发明人: Sungjun Chun , Timothy M. Skergan , Ching Lung Tong , Roger Donell Weekly
- 申请人： Sungjun Chun , Timothy M. Skergan , Ching Lung Tong , Roger Donell Weekly
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理商 Duke W. Yee; Tom Tyson; Francis Lammes
- 主分类号： G01R31/30
- IPC分类号： G01R31/30
摘要：
A computer implemented method, testing system, computer usable program code, and apparatus are provided for measuring microprocessor susceptibility to internal noise A noise generator modulates a clock signal to generate noise on a targeted component within a microprocessor. A function generator executes microprocessor functions on a plurality of functional components within the microprocessor. A maximum execution frequency on the plurality of functional components is then measured and a set of frequency ranges where the functional components are susceptible to the generated noise is determined.
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