发明授权
- 专利标题: Method and device for heat treatment
- 专利标题(中): 热处理方法和装置
-
申请号: US11211493申请日: 2005-08-26
-
公开(公告)号: US07313931B2公开(公告)日: 2008-01-01
- 发明人: Takaaki Matsuoka
- 申请人: Takaaki Matsuoka
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Crowell & Moring LLP
- 优先权: JP2001-016471 20010125
- 主分类号: C03B5/24
- IPC分类号: C03B5/24
摘要:
After carrying an LCD substrate in a reaction container of a heat treatment unit, blowing a previously heated helium gas from a gas supply part, which opposes to the surface of the LCD substrate, over the entire surface of the LCD substrate. The temperature of the LCD substrate is raised by radiation heat of a heater and heat exchange with the helium gas. After performing CVD or annealing in the reaction container, cooling the LCD substrate by blowing a gas for heat exchange having a temperature about a room temperature from the gas supply part over the entire surface of the LCD substrate. Return the cooled LCD substrate to a carrier in the carrier chamber via a conveyance chamber.
公开/授权文献
- US20050279138A1 Method and device for heat treatment 公开/授权日:2005-12-22
信息查询