发明授权
- 专利标题： Ionization source for mass spectrometer
- 专利标题（中）： 质谱仪电离源
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申请号： US11133896申请日： 2005-05-20
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公开(公告)号： US07321116B2公开(公告)日： 2008-01-22
- 发明人: Pierre Picard , Denis Lessard , André L'Heureux , Jean Lacoursiere , Philippe Nobert , Sylvain Letarte , Alexandre Vallieres , Robert Tiveron , Réal Paquin
- 申请人： Pierre Picard , Denis Lessard , André L'Heureux , Jean Lacoursiere , Philippe Nobert , Sylvain Letarte , Alexandre Vallieres , Robert Tiveron , Réal Paquin
- 申请人地址： CA Quebec
- 专利权人： Phytronix Technologies, Inc.
- 当前专利权人： Phytronix Technologies, Inc.
- 当前专利权人地址： CA Quebec
- 代理机构： Darby & Darby PC
- 优先权： CA2,480,549 20040915
- 主分类号： H01J49/04
- IPC分类号： H01J49/04
摘要：
An apparatus and method for regenerating ion samples for a mass spectrometer are provided. Source samples are loaded on a support which is heated by a laser beam, desorbing the sample without ionization. The desorbed sample is carried by a carrier gas flow through a transfer tube, at the output of which it is ionized by corona discharge or photo-ionization. The obtained ionized sample may be analyzed in a mass spectrometer or used to serve any other appropriate purpose.
公开/授权文献
- US20060054807A1 Ionization source for mass spectrometer 公开/授权日：2006-03-16
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