发明授权
- 专利标题： Spectroscopic diagnostic methods and system
- 专利标题（中）： 光谱诊断方法及系统
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申请号： US10346711申请日： 2003-01-17
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公开(公告)号： US07333189B2公开(公告)日： 2008-02-19
- 发明人: Stephen F. Fulghum, Jr. , Koichi Furusawa , Kohei Iketani
- 申请人： Stephen F. Fulghum, Jr. , Koichi Furusawa , Kohei Iketani
- 申请人地址： JP Tokyo US MA Belmont
- 专利权人： Pentax Corporation,Newton Laboratories, Inc.
- 当前专利权人： Pentax Corporation,Newton Laboratories, Inc.
- 当前专利权人地址： JP Tokyo US MA Belmont
- 代理机构： Weingarten, Schurgin, Gagnebin & Lebovici LLP
- 主分类号： G01N21/00
- IPC分类号： G01N21/00
摘要：
The present invention provides systems and methods for the determination of the physical characteristics of a structured superficial layer of material using light scattering spectroscopy. The light scattering spectroscopy system comprises optical probes that can be used with existing endoscopes without modification to the endoscope itself. The system uses a combination of optical and computational methods to detect physical characteristics such as the size distribution of cell nuclei in epithelial layers of organs. The light scattering spectroscopy system can be used alone, or in conjunction with other techniques, such as fluorescence spectroscopy and reflected light spectroscopy.
公开/授权文献
- US20030231309A1 Spectroscopic diagnostic methods and system 公开/授权日：2003-12-18
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