Invention Grant
- Patent Title: Clearance measurement system and method of operation
- Patent Title (中): 间隙测量系统和操作方法
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Application No.: US11167434Application Date: 2005-06-27
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Publication No.: US07333913B2Publication Date: 2008-02-19
- Inventor: Emad Andarawis Andarawis , Mahadevan Balasubramaniam , Todd Alan Anderson , Samhita Dasgupta , David Mulford Shaddock , Shobhana Mani , Jie Jiang
- Applicant: Emad Andarawis Andarawis , Mahadevan Balasubramaniam , Todd Alan Anderson , Samhita Dasgupta , David Mulford Shaddock , Shobhana Mani , Jie Jiang
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agency: Fletcher Yoder
- Main IPC: G01B5/14
- IPC: G01B5/14

Abstract:
A clearance measurement system is provided. The clearance measurement system includes a reference geometry disposed on a first object having an otherwise continuous surface geometry and a sensor disposed on a second object, wherein the sensor is configured to generate a first signal representative of a first sensed parameter from the first object and a second signal representative of a second sensed parameter from the reference geometry. The clearance measurement system also includes a processing unit configured to process the first and second signals to estimate a clearance between the first and second objects based upon a measurement difference between the first and second sensed parameters.
Public/Granted literature
- US20070005294A1 Clearance measurement system and method of operation Public/Granted day:2007-01-04
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