发明授权
- 专利标题: Phase adjustment apparatus and semiconductor test apparatus
- 专利标题(中): 相位调整装置及半导体测试装置
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申请号: US10850048申请日: 2004-05-20
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公开(公告)号: US07336714B2公开(公告)日: 2008-02-26
- 发明人: Masaru Goishi
- 申请人: Masaru Goishi
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Osha Liang LLP
- 优先权: JP2001-354222 20011120
- 主分类号: H03H7/30
- IPC分类号: H03H7/30
摘要:
A phase adjustment apparatus and a semiconductor test apparatus for automatically correcting irregularities of propagation delay of a transmission signal, so that the transmission signal transmitted between apparatuses while synchronized with a high-speed clock can be received at a stable optimal timing at a receiving end. The phase adjustment apparatus for transmitting a transmission signal synchronized with a clock between a first apparatus of the sending end and a second apparatus of the receiving end includes phase adjustment means used when retiming the transmission signal with the clock of the receiving end of the second apparatus. That is, the phase adjustment means corrects an unknown phase relationship between the clock of the receiving end and the transmission signal and delays the transmission signal by a specified amount for adjustment so that the signal can be received with a stable retiming condition.
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