发明授权
- 专利标题: Interface for detection and control of multiple test probes
- 专利标题(中): 用于检测和控制多个测试探针的接口
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申请号: US11413990申请日: 2006-04-28
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公开(公告)号: US07339367B2公开(公告)日: 2008-03-04
- 发明人: Dion N. Heisler , Nimal K. K. Gamage
- 申请人: Dion N. Heisler , Nimal K. K. Gamage
- 申请人地址: US CA Santa Clara
- 专利权人: Agilent Technologies, Inc.
- 当前专利权人: Agilent Technologies, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: G01R1/38
- IPC分类号: G01R1/38
摘要:
An interface module. The interface module includes a probe identification module configured for connection to an identification bus, a probe detect module configured for connection to a detect-control bus, a power control module configured for connection to the detect-control bus, a control and data module configured for connection to a control-data bus, and multiple connectors. Each connector has an associated hot swap circuit. For each connector, if the probe detect module detects connection of that connector to a test probe via connection of that connector to the probe detect module, the probe identification module is configured to enable transfer of an identification label identifying that test probe to that test probe via that connector and the control and data module is configured to enable transfer of control instructions and data between the control-data bus and the test probe via connection of the control and data module to that connector.
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