Invention Grant
- Patent Title: Method for noise improvement in ellipsometers
- Patent Title (中): 椭偏仪噪声改善方法
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Application No.: US11287701Application Date: 2005-11-28
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Publication No.: US07342661B2Publication Date: 2008-03-11
- Inventor: Martin Ebert , Lanhua Wei
- Applicant: Martin Ebert , Lanhua Wei
- Applicant Address: US CA Fremont
- Assignee: Therma-Wave, Inc.
- Current Assignee: Therma-Wave, Inc.
- Current Assignee Address: US CA Fremont
- Agency: Stallman & Pollock LLP
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
A normalization procedure for an ellipsometric system having a rotating optical element such as a polarizer or compensator is disclosed. In operation, a first DC component is extracted from the measured output signals obtained during the first 180 degrees of rotation of the optical element and a second DC component is extracted from the output signals obtained during the second 180 degrees of rotation of the optical element. The first DC component is used to normalize the output signals obtained during the first 180 degrees of rotation of the optical element and the second DC component is used to normalize the output signals obtained during the second 180 degrees of rotation of the optical element.
Public/Granted literature
- US20060132773A1 Method for noise improvement in ellipsometers Public/Granted day:2006-06-22
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