发明授权
- 专利标题: Plating solution, semiconductor device and method for manufacturing the same
- 专利标题(中): 电镀液,半导体装置及其制造方法
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申请号: US10482104申请日: 2002-11-06
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公开(公告)号: US07344986B2公开(公告)日: 2008-03-18
- 发明人: Hiroaki Inoue , Xinming Wang , Moriji Matsumoto , Makoto Kanayama
- 申请人: Hiroaki Inoue , Xinming Wang , Moriji Matsumoto , Makoto Kanayama
- 申请人地址: JP Tokyo
- 专利权人: Ebara Corporation
- 当前专利权人: Ebara Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2001-341051 20011106
- 国际申请: PCT/JP02/11572 WO 20021106
- 国际公布: WO03/041145 WO 20030515
- 主分类号: H01L21/4763
- IPC分类号: H01L21/4763
摘要:
The present invention relates to a plating solution useful for forming embedded interconnects by embedding a conductive material in fine recesses for interconnects provided in the surface of a substrate, such as a semiconductor substrate, or for forming a protective layer for protecting the surface of embedded interconnects, a semiconductor device manufactured by using the plating solution and a method for manufacturing the semiconductor device. The plating solution contains copper ions, metal ions of a metal, and the metal is capable of forming with copper a copper alloy in which the metal does not form a solid solution with copper, a complexing agent, and a reducing agent free from alkali metal.
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