Invention Grant
- Patent Title: Apparatus and method for testing component built in circuit board
- Patent Title (中): 用于测试电路板内置组件的装置和方法
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Application No.: US11131741Application Date: 2005-05-18
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Publication No.: US07345366B2Publication Date: 2008-03-18
- Inventor: Uei-Ming Jow , Min-Lin Lee , Shinn-Juh Lay , Chin-Sun Shyu , Chang-Sheng Chen
- Applicant: Uei-Ming Jow , Min-Lin Lee , Shinn-Juh Lay , Chin-Sun Shyu , Chang-Sheng Chen
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Akin, Gump, Strauss, Hauer & Feld LLP
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/58 ; G01R31/26

Abstract:
A multi-layered circuit board a built-in component including multiple terminals, at least one signal pad formed on a top surface of the multi-layered circuit board for signal transmission, each of the at least one signal pad corresponding to one of the multiple terminals, and at least one test pad formed on the top surface of the multi-layered circuit board, each of the at least one test pad corresponding to one of the at least one signal pad for testing an electric path extending from the one signal pad through the one terminal to the each of the at least one test pad.
Public/Granted literature
- US20060261482A1 Apparatus and method for testing component built in circuit board Public/Granted day:2006-11-23
Information query
IPC分类: