A method of evaluating a device under test (DUT) includes detecting four interferograms of the DUT including two orthogonal detections and two orthogonal input polarizations, performing a Hilbert transformation to obtain transfer functions of the DUT on the basis of the detected interferograms, performing an Inverse Fourier transformation on the transfer functions of the DUT to get an impulse response matrix IR of the DUT, and determining impulse response eigenvalues of the DUT on the basis of the impulse response matrix of the DUT.